Naoki Hatano
at JFE Steel Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 April 2019 Paper
Proceedings Volume 11028, 1102815 (2019) https://doi.org/10.1117/12.2516354
KEYWORDS: Cameras, Temperature metrology, Manufacturing, Annealing, Principal component analysis, Black bodies, Manufacturing equipment, Radiation thermometry, Reflection

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