Dr. Nathalie Bouet
Scientist at Brookhaven National Lab
SPIE Involvement:
Author
Publications (13)

Proceedings Article | 18 November 2019 Presentation
Proc. SPIE. 11175, Optifab 2019
KEYWORDS: Energy efficiency, X-ray optics, Polishing, Lenses, X-rays, X-ray diffraction, Ion beams, Synchrotrons, Spatial resolution, X-ray imaging

Proceedings Article | 9 September 2019 Presentation + Paper
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Mirrors, Metrology, Calibration, Error analysis, Ion beams, Deconvolution, Synchrotrons, Ion beam finishing

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Microelectromechanical systems, X-ray optics, Lenses, X-rays, X-ray microscopy, Optical alignment, Zone plates, Hard x-rays

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Microelectromechanical systems, X-ray optics, Imaging systems, Microscopy, X-rays, X-ray microscopy, Spatial resolution

Proceedings Article | 29 September 2017 Presentation
Proc. SPIE. 10389, X-Ray Nanoimaging: Instruments and Methods III
KEYWORDS: Microscopes, Diffraction, Phase contrast, Imaging systems, Luminescence, Nanoprobes, Scanning probe microscopy, Hard x-rays, Scanning probe microscopes, Absorption

Showing 5 of 13 publications
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