Mr. Nathan Pinhas Profile

Nathan Pinhas

PhD Student

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Publications (6)

Proceedings Article | 28 February 2005 Paper

Optical spectral properties of periodic micro- and nanostructures in Si and GaAs

Shlomo Hava, Nathan Pinhas, Mark Auselender, Ari Cohen-Nov

Proceedings Volume 5649, (2005) https://doi.org/10.1117/12.582430

KEYWORDS: Gallium arsenide, Silicon, Diffraction gratings, Diffraction, Nanostructures, Electromagnetism, Spectroscopy, Metals, Reflectivity, Absorbance

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Proceedings Article | 9 July 2004 Paper

Experimental study of infrared thermal emission from periodic microcavities

Nathan Pinhas, Mark Auselender, Shlomo Hava, Ari Cohen-Nov

Proceedings Volume 5360, (2004) https://doi.org/10.1117/12.527939

KEYWORDS: Gallium arsenide, Silicon, Thermography, Infrared radiation, Metals, Semiconductors, Semiconducting wafers, Optical microcavities, Electromagnetism, Temperature metrology

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Proceedings Article | 9 July 2004 Paper

Theoretical and experimental study of infrared reflection transmission and thermal emission from lamellar grating

Nathan Pinhas, Mark Auselender, Shlomo Hava, Ari Cohen-Nov

Proceedings Volume 5360, (2004) https://doi.org/10.1117/12.527946

KEYWORDS: Gallium arsenide, Diffraction gratings, Silicon, Spectroscopy, Diffraction, Thermography, Infrared radiation, Optical properties, FT-IR spectroscopy, Optical components

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Proceedings Article | 18 June 2004 Paper

Multi-layered grating diffraction graphical user interfaced simulation toolbox in the MATLAB environment

Mark Auslender, Avi Bergel, Nathan Pinhas, Shlomo Hava

Proceedings Volume 5349, (2004) https://doi.org/10.1117/12.543636

KEYWORDS: Diffraction, Diffraction gratings, MATLAB, Algorithm development, Computer simulations, Matrices, Maxwell's equations, Human-machine interfaces, Scattering, Silicon

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Proceedings Article | 29 April 2003 Paper

Infrared emission from silicon and metallic lamellar grating

Nathan Pinhas, Shlomo Hava

Proceedings Volume 5118, (2003) https://doi.org/10.1117/12.501119

KEYWORDS: Silicon, Absorption, Infrared radiation, Semiconducting wafers, Diffraction gratings, Nickel, Diffraction, Temperature metrology, Etching, Spectroscopy

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Showing 5 of 6 publications

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