Mr. Nathan Pinhas Profile

Nathan Pinhas

PhD Student

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Publications (6)

Proceedings Article | 28 February 2005 Paper

Optical spectral properties of periodic micro- and nanostructures in Si and GaAs

Shlomo Hava, Nathan Pinhas, Mark Auselender, Ari Cohen-Nov

Proc. SPIE. 5649, Smart Structures, Devices, and Systems II

KEYWORDS: Gallium arsenide, Silicon, Diffraction gratings, Diffraction, Nanostructures, Electromagnetism, Spectroscopy, Metals, Reflectivity, Absorbance

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Proceedings Article | 9 July 2004 Paper

Experimental study of infrared thermal emission from periodic microcavities

Nathan Pinhas, Mark Auselender, Shlomo Hava, Ari Cohen-Nov

Proc. SPIE. 5360, Photonic Crystal Materials and Devices II

KEYWORDS: Gallium arsenide, Silicon, Thermography, Infrared radiation, Metals, Semiconductors, Semiconducting wafers, Optical microcavities, Electromagnetism, Temperature metrology

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Proceedings Article | 9 July 2004 Paper

Theoretical and experimental study of infrared reflection transmission and thermal emission from lamellar grating

Nathan Pinhas, Mark Auselender, Shlomo Hava, Ari Cohen-Nov

Proc. SPIE. 5360, Photonic Crystal Materials and Devices II

KEYWORDS: Gallium arsenide, Diffraction gratings, Silicon, Spectroscopy, Diffraction, Thermography, Infrared radiation, Optical properties, FT-IR spectroscopy, Optical components

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Proceedings Article | 18 June 2004 Paper

Multi-layered grating diffraction graphical user interfaced simulation toolbox in the MATLAB environment

Mark Auslender, Avi Bergel, Nathan Pinhas, Shlomo Hava

Proc. SPIE. 5349, Physics and Simulation of Optoelectronic Devices XII

KEYWORDS: Diffraction, Diffraction gratings, MATLAB, Algorithm development, Computer simulations, Matrices, Maxwell's equations, Human-machine interfaces, Scattering, Silicon

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Proceedings Article | 29 April 2003 Paper

Infrared emission from silicon and metallic lamellar grating

Nathan Pinhas, Shlomo Hava

Proc. SPIE. 5118, Nanotechnology

KEYWORDS: Silicon, Absorption, Infrared radiation, Semiconducting wafers, Diffraction gratings, Nickel, Diffraction, Temperature metrology, Etching, Spectroscopy

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Showing 5 of 6 publications

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