Dr. B. Neethi Simon Profile

Dr. B. Neethi Simon

Assistant Professor

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Proceedings Article | 15 April 2010 Paper

Effect of error in crack tip identification on the photoelastic evaluation of SIFs of interface cracks

B. Neethi Simon, K Ramesh

Proceedings Volume 7522, 75220D (2010) https://doi.org/10.1117/12.852519

KEYWORDS: Photoelasticity, Interfaces, Digital photography, Error analysis, Fringe analysis, Lutetium, Electronic components, Ceramics, Solids, Experimental mechanics

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Digital photoelastic evaluation of stress intensity factors (SIFs) of bimaterial interface cracks using the method of least squares and the multi-parameter stress field equations is of current interest. For this, positional coordinates (with crack tip as origin) and corresponding fringe orders of data points are collected along isochromatic fringe contours in such a way that the geometric features of the fringe field are captured. Whole-field evaluation of isochromatic parameter is now made possible by various techniques of digital photoelasticity, enabling automation of the data collection procedure and collection of data points along fractional fringe orders as well. However, the identification of the crack tip, still done interactively, is prone to error. When the crack tip location is inaccurately identified, the evaluated SIFs are considerably different. The effect of error in precise identification of the crack tip on the evaluated SIFs is analyzed with the help of theoretically simulated fringe fields, in order to arrive at a technique by which the crack tip could be detected in a semiautomated fashion reducing this error in the evaluated SIFs.

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