Dr. Nelda Antonovaité
Product Manager at Nearfield Instruments
SPIE Involvement:
Author
Area of Expertise:
Viscoelasticity , Mechanical properties , Biomechanics , Brain mechanics , Mechanobiology , Indentation
Websites:
Publications (5)

Proceedings Article | 10 April 2024 Poster
Proceedings Volume 12955, 129552U (2024) https://doi.org/10.1117/12.3010488
KEYWORDS: Semiconducting wafers, High volume manufacturing, Metrology, Copper, Chemical mechanical planarization, Surface finishing, Semiconductor manufacturing, Process control, Miniaturization, Atomic force microscopy

Proceedings Article | 10 April 2024 Poster
Proceedings Volume 12955, 129552T (2024) https://doi.org/10.1117/12.3010482
KEYWORDS: Metrology, Semiconducting wafers, Copper, Chemical mechanical planarization, Surface roughness, High volume manufacturing, Atomic force microscopy, Wafer bonding, Wafer testing, System integration

Proceedings Article | 10 April 2024 Poster
Proceedings Volume 12955, 1295531 (2024) https://doi.org/10.1117/12.3010719
KEYWORDS: Extreme ultraviolet lithography, Metrology, 3D metrology, Nondestructive evaluation, Line width roughness, Atomic force microscopy, Surface roughness, Photoresist materials, Line edge roughness, Algorithm development

Proceedings Article | 15 March 2018 Presentation
Nelda Antonovaite, Wytse Wadman, Elly Hol, Davide Iannuzzi
Proceedings Volume 10496, 1049614 (2018) https://doi.org/10.1117/12.2288961
KEYWORDS: Brain, Tissues, Brain mapping, Mechanics, Protactinium, Neurological disorders, Atomic force microscopy, Neuroimaging, Neurons, Glia

Proceedings Article | 15 March 2018 Presentation
Marica Marrese, Nelda Antonovaité, Ben K. Nelemans, Erik Paardekam, Theodoor Smit, Davide Iannzzi
Proceedings Volume 10496, 1049615 (2018) https://doi.org/10.1117/12.2289014
KEYWORDS: Tissues, In vivo imaging, Optical coherence tomography, Elastography, Transducers, Tissue optics, Coherence (optics)

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