Dr. Nicolas Jaccard
Research Associate at Univ College London
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 1 May 2017 Paper
Proc. SPIE. 10187, Anomaly Detection and Imaging with X-Rays (ADIX) II
KEYWORDS: Transparency, Convolutional neural networks, Signal attenuation, Image processing, X-rays, Inspection, Feature extraction, Computer vision technology, Neural networks, Machine learning, X-ray imaging, Materials analysis, Network architectures, RGB color model

Proceedings Article | 1 May 2017 Presentation + Paper
Proc. SPIE. 10187, Anomaly Detection and Imaging with X-Rays (ADIX) II
KEYWORDS: Detection and tracking algorithms, Visualization, Sensors, Image segmentation, X-rays, Inspection, Image analysis, Image transmission, Machine learning, Algorithm development, X-ray imaging, X-ray detectors, System on a chip

Proceedings Article | 12 May 2016 Paper
Proc. SPIE. 9847, Anomaly Detection and Imaging with X-Rays (ADIX)
KEYWORDS: Detection and tracking algorithms, Visualization, Signal attenuation, Image segmentation, Image processing, X-rays, Inspection, Machine learning, X-ray imaging, System on a chip

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