Dr. Nicolas Vannier
Optronics Engineer at Lynred
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 12 September 2021 Presentation + Paper
A. Martin, L. Leviandier, M. Boffety, H. Sauer, J. Dupont, S. Roussel, B. Le Teurnier, F. Goudail, V. Noguier, P. Potet, N. Vannier, P. Goguillon
Proceedings Volume 11866, 118660L (2021) https://doi.org/10.1117/12.2596135
KEYWORDS: Polarization, Polarimetry, Imaging systems, Sensors, Video, Infrared imaging, Environmental sensing, Manufacturing

Proceedings Article | 4 May 2016 Paper
Nicolas Vannier, François Goudail, Corentin Plassart, Matthieu Boffety, Patrick Feneyrou, Luc Leviandier, Frédéric Galland, Nicolas Bertaux
Proceedings Volume 9853, 98530C (2016) https://doi.org/10.1117/12.2223066
KEYWORDS: Polarimetry, Imaging systems, Polarization, Image segmentation, Mueller matrices, Image processing algorithms and systems, Polysomnography, Electroluminescent displays, Manufacturing, Infrared imaging

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top