Prof. Niklas Sandler
at Åbo Akademi Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 7 November 2018 Paper
Miikka Järvinen, Tuomas Vainikka , Tapani Viitala, Carlos Bermudez, Roger Artigas, Anton Nolvi, Pol Martinez, Niklas Sandler, Edward Hæggström, Ivan Kassamakov
Proceedings Volume 10819, 108190D (2018) https://doi.org/10.1117/12.2501258
KEYWORDS: Calibration, Standards development, 3D metrology, Solids, 3D image processing, Neodymium, Time metrology, Mirrors, 3D imaging standards, Metrology

Proceedings Article | 20 February 2017 Presentation + Paper
A. Nolvi, T. Viitala, A. García Pérez, N. Sandler, E. Hæggström, C. Bermudez, R. Artigas, I. Kassamakov
Proceedings Volume 10110, 101100M (2017) https://doi.org/10.1117/12.2250261
KEYWORDS: Photonic devices, 3D imaging standards, 3D metrology, Confocal microscopy, Phase interferometry, Interferometers, Calibration, Standards development, Optical fabrication, Optical interferometry, Objectives, Microscopes, Light sources, Mirrors

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