Mr. No-Kap Park Profile

No-Kap Park

at SAMSUNG SDI Co Ltd

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Author

Publications (3)

SPIE Journal Paper | 1 July 2008

Evaluation of line-type thin-film transistor liquid-crystal display defects based on human visual perception

No-Kap Park, Suk In Yoo

JEI, Vol. 17, Issue 03, 031107, (July 2008) https://doi.org/10.1117/12.10.1117/1.2957879

KEYWORDS: Visibility, Visualization, Thin films, Transistors, Inspection, Defect detection, Detection and tracking algorithms, Liquid crystals, LCDs, Feature extraction

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Proceedings Article | 26 February 2008 Paper

Directional filter banks for detecting un-patterned TFT-LCD defect

No Kap Park, Hye Won Kim, Suk In Yoo

Proceedings Volume 6813, 68130U (2008) https://doi.org/10.1117/12.766182

KEYWORDS: Sensors, Defect detection, Edge detection, Manufacturing, Image filtering, Image processing, Detection and tracking algorithms, Image segmentation, LCDs, Eye

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Proceedings Article | 18 January 2006 Paper

Quantification of line mura defect levels based on multiple characterizing features

No K. Park, Kyu N. Choi, Suk I. Yoo

Proceedings Volume 6066, 606603 (2006) https://doi.org/10.1117/12.642828

KEYWORDS: Visibility, Optical inspection, Inspection, Visualization, Manufacturing, Distance measurement, Visual process modeling, Detection and tracking algorithms, Complex systems, Computer engineering

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