Dr. Noah Bareket
at Abbott Medical Optics
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 22 January 2001 Paper
Proc. SPIE. 4186, 20th Annual BACUS Symposium on Photomask Technology
KEYWORDS: Reticles, Ultraviolet radiation, Silicon, Inspection, Reflectivity, Chromium, Photomasks, Extreme ultraviolet, Semiconducting wafers, Charged-particle lithography

Proceedings Article | 19 July 2000 Paper
Proc. SPIE. 4066, Photomask and Next-Generation Lithography Mask Technology VII
KEYWORDS: Lithography, Multilayers, Defect detection, Glasses, Particles, Inspection, Reflectivity, Photomasks, Extreme ultraviolet, Semiconducting wafers

Proceedings Volume Editor (1)

SPIE Conference Volume | 1 August 1983

Conference Committee Involvement (1)
Wavefront Sensing
24 August 1982 | San Diego, United States
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