Dr. Oleg Konovalov
at ESRF - The European Synchrotron
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 August 2020 Paper
Proceedings Volume 11491, 114910N (2020) https://doi.org/10.1117/12.2567988
KEYWORDS: X-rays, X-ray optics, Reflectivity, Silicon, Thin films, Sensors, Lenses, Spatial resolution, Refractive index

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