Mr. Oleg U. Lashmanov Profile

Oleg U. Lashmanov

at National Research Univ of ITMO

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Author

Publications (8)

Proceedings Article | 26 June 2017 Paper

Study of landmarks estimation stability produced by AAM

Victor Glebov, Oleg Lashmanov

Proc. SPIE. 10334, Automated Visual Inspection and Machine Vision II

KEYWORDS: Signal to noise ratio, Nose, Medicine, Statistical analysis, Detection and tracking algorithms, Cameras, Magnetic resonance imaging, Image processing, Video, Error analysis, Mouth, Interference (communication), Bone, Object recognition, Biological research, Active optics, Performance modeling

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Proceedings Article | 26 June 2017 Paper

Active marks structure optimization for optical-electronic systems of spatial position control of industrial objects

Elena Sycheva, Aleksandr Vasilev, Oleg Lashmanov, Valery Korotaev

Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI

KEYWORDS: Signal to noise ratio, Light emitting diodes, Image processing, Error analysis, Reliability, Control systems, Computer simulations, Image analysis, Buildings, Optoelectronics, Diodes, Signal detection, Active optics, Probability theory, Motion controllers

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Proceedings Article | 27 April 2016 Paper

Modelling of interference pattern produced by Michelson interferometer

Victor Glebov, Oleg Lashmanov

Proc. SPIE. 9889, Optical Modelling and Design IV

KEYWORDS: Mathematical modeling, Modeling, Mirrors, Beam splitters, MATLAB, Interferometers, Sensors, Control systems, Control systems, Buildings, Vibration control, Process control, Geometrical optics, Michelson interferometers, Motion controllers

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Proceedings Article | 22 June 2015 Paper

Electrooptic converter to control linear displacements of the large structures of the buildings and facilities

Aleksandr Vasilev, Igor Konyakhin, Alexander Timofeev, Oleg Lashmanov, Fedor Molev

Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX

KEYWORDS: Metrology, Image processing, Manufacturing, Image acquisition, Field programmable gate arrays, Control systems, Buildings, Electro optics, Electro optical modeling, Temperature metrology

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Proceedings Article | 22 June 2015 Paper

Algorithm for recognition and measurement position of pitches on invar scale with submicron accuracy

Oleg Lashmanov, Valery Korotaev

Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX

KEYWORDS: Digital signal processing, Detection and tracking algorithms, Interferometers, Calibration, Image processing, Field programmable gate arrays, Control systems, Distortion, Computer programming, Optical encoders

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Proceedings Article | 21 June 2015 Paper

Modelling of microcracks image treated with fluorescent dye

Victor Glebov, Oleg Lashmanov

Proc. SPIE. 9526, Modeling Aspects in Optical Metrology V

KEYWORDS: Mathematical modeling, Modeling, MATLAB, Metals, Inspection, Nondestructive evaluation, Image analysis, Image quality, Liquids, Light

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The main reasons of catastrophes and accidents are high level of wear of equipment and violation of the production technology. The methods of nondestructive testing are designed to find out defects timely and to prevent break down of aggregates. These methods allow determining compliance of object parameters with technical requirements without destroying it. This work will discuss dye penetrant inspection or liquid penetrant inspection (DPI or LPI) methods and computer model of microcracks image treated with fluorescent dye.

Usually cracks on image look like broken extended lines with small width (about 1 to 10 pixels) and ragged edges. The used method of inspection allows to detect microcracks with depth about 10 or more micrometers.

During the work the mathematical model of image of randomly located microcracks treated with fluorescent dye was created in MATLAB environment. Background noises and distortions introduced by the optical systems are considered in the model.

The factors that have influence on the image are listed below:

1. Background noise. Background noise is caused by the bright light from external sources and it reduces contrast on the objects edges.

2. Noises on the image sensor. Digital noise manifests itself in the form of randomly located points that are differing in their brightness and color.

3. Distortions caused by aberrations of optical system. After passing through the real optical system the homocentricity of the bundle of rays is violated or homocentricity remains but rays intersect at the point that doesn’t coincide with the point of the ideal image.

The stronger the influence of the above-listed factors, the worse the image quality and therefore the analysis of the image for control of the item finds difficulty.

The mathematical model is created using the following algorithm: at the beginning the number of cracks that will be modeled is entered from keyboard. Then the point with random position is choosing on the matrix whose size is 1024x1024 pixels (result image size). This random pixel and two adjacent points are painted with random brightness, the points, located at the edges have lower brightness than the central pixel. The width of the paintbrush is 3 pixels. Further one of the eight possible directions is chosen and the painting continues in this direction. The number of ‘steps’ is also entered at the beginning of the program. This method of cracks simulating is based on theory A.N. Galybin and A.V. Dyskin, which describe cracks propagation as random walk process. These operations are repeated as many times as many cracks it’s necessary to simulate. After that background noises and Gaussian blur (for simulating bad focusing of optical system) are applied.

Proceedings Article | 1 May 2014 Paper

Alignment control optical-electronic system with duplex retroreflectors

Maksim Kleshchenok, Andrey Anisimov, Oleg Lashmanov, Alexandr Timofeev, Valery Korotaev

Proc. SPIE. 9131, Optical Modelling and Design III

KEYWORDS: Photodetectors, Retroreflectors, Light emitting diodes, LabVIEW, Cameras, Control systems, Distortion, Optoelectronics, Nonlinear optics, Optical alignment

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Proceedings Article | 13 May 2013 Paper

Absolute scale-based imaging position encoder with submicron accuracy

Andrey Anisimov, Anton Pantyushin, Oleg Lashmanov, A. Vasilev, Alexander Timofeev, Valery Korotaev, Sergey Gordeev

Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII

KEYWORDS: Optical design, Prisms, Imaging systems, Sensors, Calibration, Image processing, Magnetism, Computer programming, Charge-coupled devices, Standards development

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Showing 5 of 8 publications

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