Dr. Oliver Bunk Profile

Dr. Oliver Bunk

at Paul Scherrer Institut

SPIE Involvement:

Author

Publications (13)

Proceedings Article | 18 September 2015 Paper

Ptychographic nanotomography at the Swiss Light Source

Manuel Guizar-Sicairos, Mirko Holler, Ana Diaz, Julio da Silva, Esther Tsai, Oliver Bunk, Carlos Martinez-Perez, Philip Donoghue, Charles Wellman, Andreas Menzel

Proceedings Volume 9592, 95920A (2015) https://doi.org/10.1117/12.2188313

KEYWORDS: X-rays, Light sources, Reconstruction algorithms, Tomography, Algorithm development, X-ray microscopy, Coherence imaging, X-ray imaging, X-ray characterization, Refractive index

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SPIE Journal Paper | 2 July 2012

Anisotropy in polyetheretherketone films

Jasmin Althaus, Hans Deyhle, Bert Müller, Oliver Bunk, Per Magnus Kristiansen

JNP, Vol. 6, Issue 01, 063510, (July 2012) https://doi.org/10.1117/12.10.1117/1.JNP.6.063510

KEYWORDS: Anisotropy, Annealing, Scattering, Crystals, Polymers, X-rays, Polarizers, Optical testing, Polymer thin films, Nanostructures

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Proceedings Article | 3 November 2011 Paper

X-ray phase nanotomography through ptychographic coherent lensless imaging

Manuel Guizar-Sicairos, Ana Diaz, Andreas Menzel, Oliver Bunk

Proceedings Volume 8011, 80118F (2011) https://doi.org/10.1117/12.903688

KEYWORDS: X-rays, Coherence imaging, X-ray imaging, Tomography, X-ray microscopy, X-ray diffraction, Algorithm development, Absorption, Image quality, X-ray computed tomography

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Proceedings Article | 28 September 2011 Paper

Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging

Joan Vila-Comamala, Ana Diaz, Manuel Guizar-Sicairos, Sergey Gorelick, Vitaliy Guzenko, Petri Karvinen, Cameron Kewish, Elina Färm, Mikko Ritala, Alexandre Mantion, Oliver Bunk, Andreas Menzel, Christian David

Proceedings Volume 8139, 81390E (2011) https://doi.org/10.1117/12.893235

KEYWORDS: X-rays, Coherence imaging, Iridium, X-ray optics, Electron beam lithography, Zone plates, X-ray diffraction, Reconstruction algorithms, Hard x-rays, Spatial resolution

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Proceedings Article | 13 May 2010 Paper

Refractive x-ray optics made from polymer microstructures

M. Simon, V. Nazmov, E. Reznikova, A. Last, J. Mohr, P.-J. Jakobs, V. Saile, O. Bunk, C. Kewish, D. Batchelor, R. Simon

Proceedings Volume 7716, 77161B (2010) https://doi.org/10.1117/12.858894

KEYWORDS: Lenses, X-rays, Prisms, X-ray optics, X-ray lithography, Polymers, Synchrotron technology, X-ray microscopy, Photorefractive polymers, X-ray imaging

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Proceedings Article | 22 March 2010 Paper

Quantitative multimodal x-ray tomography: absorption, phase, and darkfield contrast

Martin Bech, Oliver Bunk, Tilman Donath, Robert Feidenhans'l, Christian David, Franz Pfeiffer

Proceedings Volume 7622, 76220N (2010) https://doi.org/10.1117/12.845921

KEYWORDS: Tomography, Scattering, X-ray imaging, X-rays, Visibility, Diffusion, Absorption, Image transmission, Computed tomography, Interferometers

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Proceedings Article | 21 August 2009 Paper

Bio-inspired dental fillings

Hans Deyhle, Oliver Bunk, Stefan Buser, Gabriel Krastl, Nicola Zitzmann, Bernd Ilgenstein, Felix Beckmann, Franz Pfeiffer, Roland Weiger, Bert Müller

Proceedings Volume 7401, 74010E (2009) https://doi.org/10.1117/12.827437

KEYWORDS: Teeth, Nanostructures, X-rays, Tissues, Scattering, Spatial resolution, Crystals, Absorption, Biomimetics, Computed tomography

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Proceedings Article | 22 May 2009 Paper

Advanced methods in scanning x-ray microscopy

A. Menzel, M. Dierolf, C. Kewish, P. Thibault, K. Jefimovs, C. David, M. Bech, T. Jensen, R. Feidenhans'l, A.-M. Heegaard, R. Hansen, T. Berthing, K. Martinez, J. Als-Nielsen, S. Kapishnikov, L. Leiserowitz, F. Pfeiffer, O. Bunk

Proceedings Volume 7378, 73780O (2009) https://doi.org/10.1117/12.821823

KEYWORDS: X-ray microscopy, X-rays, Microscopy, Scattering, X-ray imaging, Light scattering, Coherence imaging, Sensors, Optics manufacturing, Phase contrast

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Proceedings Article | 16 September 2008 Paper

Phase-contrast imaging and tomography at 60 keV using a conventional x-ray tube

T. Donath, F. Pfeiffer, O. Bunk, W. Groot, M. Bednarzik, C. Grünzweig, E. Hempel, S. Popescu, M. Hoheisel, C. David

Proceedings Volume 7078, 707817 (2008) https://doi.org/10.1117/12.794699

KEYWORDS: X-rays, Interferometers, X-ray imaging, Tomography, Refractive index, Signal attenuation, X-ray computed tomography, Phase measurement, X-ray sources, X-ray detectors

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Proceedings Article | 16 September 2008 Paper

Advances in the visualization of unstained brain tumors using grating-based x-ray phase-contrast tomography

Franz Pfeiffer, Oliver Bunk, Christian David, Martin Bech, Geraldine Le Duc, Alberto Bravin, Peter Cloetens

Proceedings Volume 7078, 707815 (2008) https://doi.org/10.1117/12.794666

KEYWORDS: Tomography, Brain, Tumors, X-rays, Tissues, Neuroimaging, Cerebellum, X-ray sources, 3D image reconstruction, Visualization

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Proceedings Article | 5 September 2008 Paper

Advances in ptychographical coherent diffractive imaging

Andreas Menzel, Pierre Thibault, Martin Dierolf, Cameron Kewish, Oliver Bunk, Christian David, Wolfram Leitenberger, Franz Pfeiffer

Proceedings Volume 7076, 707609 (2008) https://doi.org/10.1117/12.794186

KEYWORDS: Coherence imaging, Diffraction, Reconstruction algorithms, X-rays, X-ray microscopy, Phase retrieval, Image retrieval, X-ray optics, Sensors, Deconvolution

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Proceedings Article | 7 September 2006 Paper

Tomography with grating interferometers at low-brilliance sources

Timm Weitkamp, Christian David, Christian Kottler, Oliver Bunk, Franz Pfeiffer

Proceedings Volume 6318, 63180S (2006) https://doi.org/10.1117/12.683851

KEYWORDS: Interferometers, X-rays, Visibility, Beam splitters, Fringe analysis, Tomography, Absorption, Wavefronts, Sensors, X-ray sources

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Proceedings Article | 8 September 2004 Paper

Self-assembled liquid crystalline solution processable semiconductors

Maxim Shkunov, Weimin Zhang, Clare Bailey, Bryan Fleming, Mark Giles, Martin Heeney, Iain Love, David Sparrowe, Steve Tierney, Iain McCulloch, Martin Nielsen, Dag Breiby, Oliver Bunk

Proceedings Volume 5464, (2004) https://doi.org/10.1117/12.545729

KEYWORDS: Field effect transistors, Liquid crystals, Transistors, Molecules, Crystals, Semiconductors, Liquids, Targeting Task Performance metric, Molecular self-assembly, Temperature metrology

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Showing 5 of 13 publications

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