Dr. Olivier Hignette
Senior Engineer at ESRF
SPIE Involvement:
Author
Publications (18)

Proceedings Article | 29 August 2006 Paper
Proc. SPIE. 6317, Advances in X-Ray/EUV Optics, Components, and Applications
KEYWORDS: Diffraction, Mirrors, Multilayers, X-ray optics, Reflection, X-rays, Coating, Reflectivity, Refraction, Synchrotrons

Proceedings Article | 17 September 2005 Paper
Proc. SPIE. 5921, Advances in Metrology for X-Ray and EUV Optics
KEYWORDS: Mirrors, Metrology, Sensors, Error analysis, X-rays, Silicon, Fourier transforms, Optical metrology, Synchrotron radiation, Data conversion

Proceedings Article | 17 September 2005 Paper
Proc. SPIE. 5921, Advances in Metrology for X-Ray and EUV Optics
KEYWORDS: Optical components, Mirrors, Metrology, Interferometers, Calibration, X-rays, Interferometry, Platinum, Optical testing, Head

Proceedings Article | 23 December 2003 Paper
Proc. SPIE. 5195, Crystals, Multilayers, and Other Synchrotron Optics
KEYWORDS: Diffraction, Polishing, Etching, Crystals, X-rays, X-ray diffraction, Silicon, Laser crystals, Monochromators, Surface finishing

Proceedings Article | 24 December 2002 Paper
Proc. SPIE. 4782, X-Ray Mirrors, Crystals, and Multilayers II
KEYWORDS: Actuators, Mirrors, Multilayers, X-rays, Interfaces, Silicon, Reflectivity, Platinum, Californium, Alignment procedures

Showing 5 of 18 publications
Conference Committee Involvement (4)
Advances in Metrology for X-Ray and EUV Optics II
30 August 2007 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components II
27 August 2007 | San Diego, California, United States
Advances in X-Ray/EUV Optics, Components, and Applications
14 August 2006 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics
2 August 2005 | San Diego, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top