Dr. Osamu Goto
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 15 October 2012 Paper
Osamu Goto, Shigetaka Tomiya, Yosuke Murakami, Akira Shinozaki, Akira Toda, Jiro Kasahara, Daisuke Hobara
Proceedings Volume 8478, 84780C (2012) https://doi.org/10.1117/12.943223
KEYWORDS: Thin films, Crystals, Transmission electron microscopy, Organic semiconductors, Thin film growth, Photomicroscopy, Diffraction, Computational fluid dynamics, Computer simulations, Transistors

Proceedings Article | 15 February 2008 Paper
Shigetaka Tomiya, Osamu Goto, Masao Ikeda
Proceedings Volume 6894, 68940N (2008) https://doi.org/10.1117/12.767769
KEYWORDS: Semiconductor lasers, Gallium nitride, Quantum wells, Transmission electron microscopy, High power lasers, Interfaces, Indium, Laser video displays, Structural analysis, Optical damage

Proceedings Article | 8 February 2007 Paper
Osamu Goto, Shigetaka Tomiya, Yukio Hoshina, Takayuki Tanaka, Makoto Ohta, Yoshitsugu Ohizumi, Yoshifumi Yabuki, Kenji Funato, Masao Ikeda
Proceedings Volume 6485, 64850Z (2007) https://doi.org/10.1117/12.725162
KEYWORDS: Interfaces, Semiconductor lasers, Continuous wave operation, Gallium, Transmission electron microscopy, High power lasers, Quantum wells, Aluminum, Laser development, Metalorganic chemical vapor deposition

Proceedings Article | 22 February 2006 Paper
Shigetaka Tomiya, Tomonori Hino, Takao Miyajima, Osamu Goto, Masao Ikeda
Proceedings Volume 6133, 613308 (2006) https://doi.org/10.1117/12.643288
KEYWORDS: Magnesium, Transmission electron microscopy, Gallium nitride, Epitaxial lateral overgrowth, Semiconductor lasers, Reliability, Doping, Quantum wells, Structural analysis, Diffraction

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