We report the implantation of Ni and Ti ions in Nd:YAG crystals to generate a modified layer near the surface. The SRIM (Stopping and Range of Ions in Matter) program was used to simulate this damage layer giving ~ 2 microns in depth. From EDS and XPS measurements, a Ni/Ti concentration of ~ 0.05 - 0.15 at.% was calculated. Spectroscopic characterization was realized consisting in absorption, luminescence and decay lifetime. These are preliminary results for the combination of rare earth and transition metal ions to obtain upconversion processes in active materials for the development of integrated light sources in the visible region.
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