Dr. Owen M Williams
Retired
SPIE Involvement:
Author | Instructor
Publications (46)

Proceedings Article | 25 July 2013 Paper
Proc. SPIE. 8707, Technologies for Synthetic Environments: Hardware-in-the-Loop XVIII
KEYWORDS: Sun, Data modeling, Reflection, Computer simulations, Clouds, 3D modeling, Convection, Infrared signatures, Thermal modeling, Radiative transfer

Proceedings Article | 13 May 2011 Paper
Proc. SPIE. 8015, Technologies for Synthetic Environments: Hardware-in-the-Loop XVI
KEYWORDS: Infrared imaging, Foam, Visualization, Cameras, LIDAR, Sensors, Computer simulations, Infrared radiation, Scene simulation, Signal detection

Proceedings Article | 24 April 2010 Paper
Proc. SPIE. 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
KEYWORDS: Foam, Reflection, Particles, Reflectivity, Computer simulations, Wave propagation, Scene simulation, Motion models, Systems modeling, Solid modeling

Proceedings Article | 24 April 2010 Paper
Proc. SPIE. 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
KEYWORDS: Long wavelength infrared, Infrared imaging, Mid-IR, Reflection, Reflectivity, Computer simulations, Clouds, Projection systems, Infrared radiation, Radiometry

Proceedings Article | 23 April 2009 Paper
Proc. SPIE. 7301, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV
KEYWORDS: Foam, Visualization, Reflection, Graphics processing units, Particles, Computer simulations, Light sources and illumination, Infrared radiation, Radiometry, Motion models

Showing 5 of 46 publications
Conference Committee Involvement (9)
Technologies for Synthetic Environments: Hardware-in-the-Loop XVII
25 April 2012 | Baltimore, Maryland, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
7 April 2010 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV
13 April 2009 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII
17 March 2008 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
10 April 2007 | Orlando, Florida, United States
Showing 5 of 9 Conference Committees
Course Instructor
SC164: Dynamic Infrared Scene Projection
Dynamic infrared scene projection is developing rapidly, driven by the need to simulate imaging infrared systems against complex real-time scenes generated in either a closed-loop or open-loop environment. Applications include simulated operation of imaging infrared missile seekers, search and track systems, thermal imagers and FLIRs, re-entry vehicle trackers, threat warners and infrared fuzes. This course provides a presentation of the status of dynamic infrared scene projection that with a background in infrared imaging technology is designed for users of real-time infrared projection systems.
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