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Peter Ahn
at SK Hynix Inc
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Publications (1)
Proceedings Article | 13 March 2015 Paper
Power noise rejection and device noise analysis at the reference level of ramp ADC
Peter Ahn, JiYong Um, EunJung Choi, HyunMook Park, JaSeung Gou, KwangJun Cho, KangBong Seo, SangDong Yoo
Proceedings Volume 9403, 94030M (2015) https://doi.org/10.1117/12.2083099
KEYWORDS: Interference (communication), Field effect transistors, Power supplies, Imaging systems, Resistors, Capacitance, Remote sensing, Resistance, Image resolution, Analog electronics
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