Mr. Peter Ahn Profile

Peter Ahn

at SK Hynix Inc

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Publications (1)

Proceedings Article | 13 March 2015 Paper

Power noise rejection and device noise analysis at the reference level of ramp ADC

Peter Ahn, JiYong Um, EunJung Choi, HyunMook Park, JaSeung Gou, KwangJun Cho, KangBong Seo, SangDong Yoo

Proc. SPIE. 9403, Image Sensors and Imaging Systems 2015

KEYWORDS: Imaging systems, Remote sensing, Resistance, Image resolution, Interference (communication), Power supplies, Capacitance, Field effect transistors, Resistors, Analog electronics

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