Dr. Pablo Pedreira Conchado
at Alba Synchrotron Light Source
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 8 September 2016 Presentation + Paper
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Optical components, Mirrors, Optical design, Mechanics, Diagnostics, Ray tracing, Spectral resolution, Optical alignment, Tolerancing, Optics manufacturing

Proceedings Article | 8 September 2016 Presentation + Paper
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Mirrors, X-ray optics, Nano opto mechanical systems, Denoising, Data acquisition, Time metrology, Autocollimators, Synchrotrons, Motion measurement, Laser beam diagnostics

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