Mr. Pascal Gilgenkrantz Profile

Pascal Gilgenkrantz

HPC&Cloud Product Manager for Calibre Semi-Manuf. at Siemens EDA

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 10 April 2024 Presentation + Paper

Cloud flight plan for post-tapeout flow jobs

Pascal Gilgenkrantz, Bassem Riad, Maram Salah, Azim Siddique

Proceedings Volume 12954, 129540O (2024) https://doi.org/10.1117/12.3010142

KEYWORDS: Clouds, Electronic design automation, Optical proximity correction, Simulations, Lithography, Computer hardware, Organization management, Photomasks, Statistical analysis, Signal processing

Read Abstract +

Proceedings Article | 28 April 2023 Poster + Paper

CPU time prediction using machine learning for post-tapeout flow runs

Maram Salah, Ahmed Hamed Fathi Hamed, Stephen Kim, Pascal Gilgenkrantz, Wooil Han, Roberto Ramsis, Ken Jantzen

Proceedings Volume 12495, 124951O (2023) https://doi.org/10.1117/12.2657666

KEYWORDS: Data analysis, Data modeling, Machine learning, Feature extraction

Read Abstract +

Proceedings Article | 3 October 2018 Presentation + Paper

Extending mask data preparation to scale to thousands of CPUs and beyond

Archana Rajagopalan, Amanda Bowhill, Peter Buck, Bhardwaj Durvasula, Pascal Gilgenkrantz, Stephen Kim, Minyoung Park, Nageswara Rao, Steffen Schulze

Proceedings Volume 10810, 108100L (2018) https://doi.org/10.1117/12.2503551

KEYWORDS: Distributed computing, Data processing, Data storage servers, Data communications, Computing systems, Optical proximity correction

Read Abstract +

Proceedings Article | 19 September 2018 Paper

Maximizing utilization of large-scale mask data preparation clusters

Pascal Gilgenkrantz, Stephen Kim, Wooil Han, Minyoung Park, Min Tsao

Proceedings Volume 10775, 1077513 (2018) https://doi.org/10.1117/12.2326553

KEYWORDS: Optical proximity correction, Lithography, Photomasks, Visualization, Manufacturing, Network architectures, Electronic design automation, Operating systems

Read Abstract +

Proceedings Article | 19 March 2015 Paper

Predictability and impact of product layout induced topology on across-field focus control

J.-G. Simiz, T. Hasan, F. Staals, B. Le-Gratiet, P. Gilgenkrantz, A. Villaret, F. Pasqualini, W. Tel, C. Prentice, A. Tishchenko

Proceedings Volume 9424, 94241C (2015) https://doi.org/10.1117/12.2085283

KEYWORDS: Semiconducting wafers, Scanners, Sensors, Data modeling, Finite element methods, Silicon, Wafer-level optics, Convolution, Photomasks, Chemical mechanical planarization

Read Abstract +

Proceedings Article | 2 April 2011 Paper

Augmented reality for wafer prober

Pascal Gilgenkrantz

Proceedings Volume 7985, 79850M (2011) https://doi.org/10.1117/12.882521

KEYWORDS: Semiconducting wafers, Photomasks, Cameras, Augmented reality, Manufacturing, Databases, Wafer manufacturing, Wafer testing, Standards development, Zoom lenses

Read Abstract +

Showing 5 of 6 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years