Pascal Grosmann
at Fraunhofer IOF
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 May 2019 Paper
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: 3D acquisition, Scanners, 3D modeling, 3D metrology, Reconstruction algorithms, 3D image processing

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