Prof. Pascal Picart
Prof. at Univ du Maine
SPIE Involvement:
Conference Program Committee | Editor | Author
Area of Expertise:
coherent imaging , digital holography , interferometry , optical metrology , signal processing , image processing
Profile Summary

Pascal Picart is a Professor at Le Mans Université, France. He graduated from the École Supérieure d’Optique in 1992 and received his PhD in physics from the University of Paris XI, Orsay, France, in 1995. He joined Le Mans University in 1996. He is the author of 88 journal papers, 18 invited talks, 90 articles in international conferences, 7 book chapters, coordinated 3 books and co-founded one start-up. His research topics are connected with coherent imaging based on digital holography and its various applications to acoustics, mechanics and fluid mechanics.

Pascal Picart is member of the Optical Society of America (OSA), SPIE, Société Française d’Optique (SFO), European Optical society (EOS), Club EEA, Institute of Electrical and Electronics Engineers (IEEE).

updated : March, 3, 2019
Publications (40)

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Speckle, Digital holography, Databases, Error analysis, Signal to noise ratio, Optical metrology, Holography, Image processing, Denoising, Fringe analysis

Proceedings Article | 16 July 2019 Paper
Proc. SPIE. 11172, Fourteenth International Conference on Quality Control by Artificial Vision
KEYWORDS: Digital holography, 3D metrology, Teeth, Holograms, Optical metrology, Sensors, Holography, 3D image processing, Vibrometry, Coherence imaging

Proceedings Article | 21 June 2019 Presentation + Paper
Proc. SPIE. 11060, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials IV
KEYWORDS: Teeth, Digital holography, Ceramics, 3D metrology, Holography, Fringe analysis, Deflectometry, Speckle interferometry, Interferometry, Digital photography

Proceedings Article | 7 September 2018 Paper
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Speckle, Contrast transfer function, Signal to noise ratio, Digital filtering, Image filtering, Digital holography, Image processing, Wavelets, Detection and tracking algorithms, Holograms

Proceedings Article | 7 September 2018 Paper
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Teeth, Digital holography, Ceramics, Holograms, Holography, Sensors, Manufacturing, Doppler effect, Computer aided design, 3D metrology

Showing 5 of 40 publications
Proceedings Volume Editor (1)

SPIE Conference Volume | 16 April 2020

Conference Committee Involvement (11)
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Online Only, Germany
Digital Optical Technologies 2021
21 June 2021 | Online Only, Germany
Digital Optics for Immersive Displays II (DOID20)
7 April 2020 | Online Only, France
Optics and Photonics for Advanced Dimensional Metrology
6 April 2020 | Online Only, France
Digital Optical Technologies II
24 June 2019 | Munich, Germany
Showing 5 of 11 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top