Patrick G. Hogue
Senior Process Engineer at Johns Hopkins Univ
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 7 September 2006 Paper
Proc. SPIE. 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II
KEYWORDS: Space operations, Bacteria, Microorganisms, Contamination, Organisms, Ultraviolet radiation, Control systems, Nitrogen, Natural surfaces, Corrosion

Proceedings Article | 7 September 2006 Paper
Proc. SPIE. 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II
KEYWORDS: Statistical analysis, Nitrogen, Contamination, Solids, Chemical analysis, Calibration, Fiber coatings, Liquids, Coating, Spectroscopy

Proceedings Article | 7 September 2006 Paper
Proc. SPIE. 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II
KEYWORDS: Particles, Space operations, Silicon, Picture Archiving and Communication System, Sodium, Aluminum, Silicon carbide, Atmospheric particles, Chlorine, Pluto

Proceedings Article | 22 September 2005 Paper
Proc. SPIE. 5906, Astrobiology and Planetary Missions
KEYWORDS: Charge-coupled devices, Space operations, Pluto, Telescopes, Space telescopes, Mirrors, Imaging systems, Silicon carbide, Sensors, Aluminum

Proceedings Article | 15 October 2004 Paper
Proc. SPIE. 5526, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control
KEYWORDS: Glasses, Particles, Space operations, Optical inspection, Contamination control, Imaging systems, Image analysis, Instrument modeling, Semiconducting wafers, Optical scanning systems

Showing 5 of 6 publications
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