Patrick Kienle
at Technische Univ München
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 20 September 2020 Presentation + Paper
Proc. SPIE. 11537, Electro-Optical and Infrared Systems: Technology and Applications XVII
KEYWORDS: Spectroscopy, Mid-IR, Fourier transforms, Time resolved spectroscopy, Spectral resolution, Light sources, FT-IR spectroscopy, Fourier optics, Signal to noise ratio, Mirrors

Proceedings Article | 20 August 2020 Presentation + Paper
Proc. SPIE. 11500, ODS 2020: Industrial Optical Devices and Systems
KEYWORDS: Distance measurement, Sensors, Image sensors, Modulation, Laser systems engineering, Optical simulations, Laser scattering, Detection and tracking algorithms

Proceedings Article | 3 September 2019 Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Mirrors, Spectroscopy, Sensors, Fourier transforms, FT-IR spectroscopy, Beam splitters, Light sources, Off axis mirrors, Interferometers, Transmittance

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Image segmentation, Image processing algorithms and systems, Sensors, Detection and tracking algorithms, Quantization, Image filtering, Image processing, Laser processing, Laser applications

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Spectroscopy, Fourier transforms, Light sources, Detector arrays, Interferometers, Beam splitters, Sensors, Spectral resolution, Mirrors, Imaging systems

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