Dr. Patrick I. Oden Profile

Dr. Patrick I. Oden

TI Fellow at Texas Instruments Inc

SPIE Involvement:

Author | Editor

Proceedings Article | 28 February 2020 Presentation + Paper

Innovations with a massively paralleled, microelectromechanical systems (MEMS) toward piston-mode-based phase light modulator (PLM)

Patrick Oden, Terry Bartlett, William McDonald, James Baker, James Hall

Proc. SPIE. 11294, Emerging Digital Micromirror Device Based Systems and Applications XII

KEYWORDS: Microelectromechanical systems, Diffraction, Mirrors, Modulation, Electrodes, Manufacturing, Phase shift keying, Modulators, Digital micromirror devices, Mirror structures

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SPIE Journal Paper | 21 March 2014

Special Section Guest Editorial: Emerging MOEMS Technology and Applications

M. Edward Motamedi, Joel Kubby, Patrick Oden, Wibool Piyawattanametha

JM3 Vol. 13 Issue 01

KEYWORDS: Microopto electromechanical systems, Microelectromechanical systems, Micro optics, Mirrors, Photonics, Technologies and applications, Digital micromirror devices, Microsystems, Actuators

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Proceedings Article | 30 April 2008 Paper

Texas Instruments' DLP products massively paralleled MOEMS arrays for display applications: a distant second to Mother Nature

P. Oden

Proc. SPIE. 6959, Micro (MEMS) and Nanotechnologies for Space, Defense, and Security II

KEYWORDS: Microelectromechanical systems, Mirrors, Visualization, Data storage, Reliability, Spatial light modulators, Projection systems, Microopto electromechanical systems, Digital micromirror devices, Digital Light Processing

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Proceedings Article | 14 August 2006 Paper

Non-destructive structural homogeneity of MOEMS arrays: applications of a through-transmissive-media interferometer on a digital mirror device-spatial light modulator

L. Heine, P. Oden

Proc. SPIE. 6293, Interferometry XIII: Applications

KEYWORDS: Mirrors, Interferometers, Image segmentation, Inspection, Nondestructive evaluation, Spatial light modulators, Objectives, Microopto electromechanical systems, Digital micromirror devices, Digital Light Processing

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Proceedings Article | 4 December 1998 Paper

Thin metal island plasmon sensor

Fabrice Meriaudeau, Todd Downey, A. Passian, Patrick Oden, A. Wig, P. Crilly, S. Mangeant, Trinidad Ferrell

Proc. SPIE. 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications

KEYWORDS: Gold, Plasmons, Sensors, Quartz, Metals, Particles, Dielectrics, Refraction, Absorbance, Liquids

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Proceedings Article | 4 December 1998 Paper

Chemically sensitive surface plasmon devices employing a self-assembled monolayer composite film

J. DePriest, Fabrice Meriaudeau, Patrick Oden, Todd Downey, A. Passian, A. Wig, Trinidad Ferrell

Proc. SPIE. 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications

KEYWORDS: Gold, Surface plasmons, Sensors, Quartz, Metals, Composites, Nitrogen, Reflectivity, Chemical elements, Self-assembled monolayers

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Proceedings Article | 20 July 1998 Paper

MEMS sensors and wireless telemetry for distributed systems

Charles Britton, R. Warmack, S. Smith, Patrick Oden, Gilbert Brown, W. Bryan, Lloyd Clonts, Michael Duncan, Mike Emery, M. Ericson, Z. Hu, Robert Jones, Michael Moore, J. Moore, Jim Rochelle, Timothy Threatt, Thomas Thundat, Gary Turner, Alan Wintenberg

Proc. SPIE. 3328, Smart Structures and Materials 1998: Smart Electronics and MEMS

KEYWORDS: Microelectromechanical systems, Logic, Clocks, Capacitors, Sensors, Mercury, Amplifiers, Data acquisition, Capacitance, Analog electronics

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Proceedings Article | 21 October 1996 Paper

Piezoresistive microcantilever optimization for uncooled infrared detection technology

Slobodan Rajic, Boyd Evans, Panos Datskos, Patrick Oden, Thomas Thundat, Charles Egert

Proc. SPIE. 2817, Infrared Spaceborne Remote Sensing IV

KEYWORDS: Infrared detectors, Thermography, Infrared sensors, Sensors, Silicon, Resistance, Finite element methods, Infrared radiation, Infrared detection, Temperature metrology

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Proceedings Article | 27 June 1996 Paper

Optical and infrared detection using microcantilevers

Patrick Oden, Eric Wachter, Panos Datskos, Thomas Thundat, R. Warmack

Proc. SPIE. 2744, Infrared Technology and Applications XXII

KEYWORDS: Infrared detectors, Thermography, Infrared sensors, Modulation, Sensors, Silicon, Coating, Infrared radiation, Optics manufacturing, Temperature metrology

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Proceedings Article | 1 May 1992 Paper

Nanofabrication utilizing the atomic-force microscope

L. Nagahara, Patrick Oden, Arun Majumdar, J. Carrejo, J. Graham, John Alexander

Proc. SPIE. 1639, Scanning Probe Microscopies

KEYWORDS: Gold, Lithography, Polymethylmethacrylate, Metals, Atomic force microscopy, Photoresist materials, Scanning probe microscopy, Nanofabrication, Nanolithography, Scanning tunneling microscopy

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