Paul Barber
Senior Director of Operations at FLIR Systems Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 September 2013 Paper
Michael Aghajanian, Craig Emmons, Steve Rummel, Paul Barber, Chris Robb, Doug Hibbard
Proceedings Volume 8837, 88370J (2013) https://doi.org/10.1117/12.2024308
KEYWORDS: Silicon carbide, Ceramics, Silicon, Particles, Surface roughness, Polishing, Carbon, Thermography, Composites, Photomicroscopy

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