Paul T. Bryant
Owner/Proprietor at Left Coast Consulting
SPIE Involvement:
Author
Publications (23)

Proceedings Article | 30 April 2007 Paper
Proc. SPIE. 6544, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
KEYWORDS: Microelectromechanical systems, Packaging, Mid-IR, Electronics, Interfaces, Analog electronics, Digital electronics, Cryogenics, Prototyping, Temperature metrology

Proceedings Article | 30 April 2007 Paper
Proc. SPIE. 6543, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII
KEYWORDS: Staring arrays, Infrared imaging, Imaging systems, Cameras, Fourier transforms, Optical testing, Collimators, Infrared radiation, Modulation transfer functions, Infrared lenses

Proceedings Article | 16 May 2006 Paper
Proc. SPIE. 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
KEYWORDS: Electronics, Tungsten, Interfaces, Resistance, Control systems, Infrared radiation, Heatsinks, Semiconducting wafers, Cryogenics, Prototyping

Proceedings Article | 16 May 2006 Paper
Proc. SPIE. 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
KEYWORDS: Nonuniformity corrections, Human-machine interfaces, Infrared imaging, Electronics, Image processing, Video, Control systems, Projection systems, Infrared radiation, Temperature metrology

Proceedings Article | 15 May 2006 Paper
Proc. SPIE. 6207, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVII
KEYWORDS: Bolometers, Microelectromechanical systems, Microbolometers, Thermography, Infrared sensors, Infrared imaging, Sensors, Projection systems, Infrared radiation, Resistors

Showing 5 of 23 publications
Conference Committee Involvement (5)
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII
17 March 2008 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
10 April 2007 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
18 April 2006 | Orlando (Kissimmee), Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
29 March 2005 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
13 April 2004 | Orlando, Florida, United States
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