Paul Digraci
at Lab des Technologies de La Microélectronique
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 May 2022 Presentation + Paper
Proceedings Volume 12053, 120530W (2022) https://doi.org/10.1117/12.2612798
KEYWORDS: Metrology, Neurons, Statistical analysis, Neural networks, Data modeling, Data fusion, Critical dimension metrology, Artificial neural networks

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