Dr. Paul P. K. Lee
Senior Technical Staff
SPIE Involvement:
Author
Area of Expertise:
CMOS Image Sensor , Detector Physics and Technology , Spectral Imaging and Exploitation , Remote Sensing , Image Processing , Microelectronics
Profile Summary

Paul P. K. Lee received the B.S. with Distinction in Engineering Physics, M.S. in Applied & Engineering Physics from Cornell University. He continued his graduate work at the University of Rochester in Biomedical Engineering and earned his M.S. and Ph.D. degrees in Electrical Engineering. He is currently a Technical Staff at ITT Exelis where he has been a principal investigator, technical lead, IPT Lead and individual contributor to a number of
IR&D projects and EO sensor development programs. His current interests are in low light sensors and hyperspectral imaging. He has published over 30 technical papers, co-edited 6 conference Proceedings and received over 20 US and many international patents. In 2010 he received the IEEE Region 1 Award in Technological Innovation for his work in CMOS image sensor. He is a Senior Member of the IEEE.
Publications (14)

Proceedings Article | 23 February 2018 Paper
Proc. SPIE. 10531, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI
KEYWORDS: CMOS sensors, Sensors, Terahertz radiation, Antennas, Field effect transistors, CMOS technology, CMOS devices

Proceedings Article | 13 May 2015 Paper
Proc. SPIE. 9483, Terahertz Physics, Devices, and Systems IX: Advanced Applications in Industry and Defense
KEYWORDS: Finite-difference time-domain method, Imaging systems, Sensors, Metals, Silicon, Terahertz radiation, Optical simulations, Antennas, Resistors, Absorption

Proceedings Article | 13 May 2015 Paper
Proc. SPIE. 9483, Terahertz Physics, Devices, and Systems IX: Advanced Applications in Industry and Defense
KEYWORDS: Standoff detection, Imaging systems, Sensors, Interference (communication), Solids, Terahertz radiation, Antennas, CMOS technology, Raster graphics, Signal detection

Proceedings Article | 21 May 2014 Paper
Proc. SPIE. 9102, Terahertz Physics, Devices, and Systems VIII: Advanced Applications in Industry and Defense
KEYWORDS: CMOS sensors, Imaging systems, Sensors, Silicon, Resistance, Terahertz radiation, Transistors, Field effect transistors, CMOS technology, Camera shutters

Proceedings Article | 21 May 2014 Paper
Proc. SPIE. 9102, Terahertz Physics, Devices, and Systems VIII: Advanced Applications in Industry and Defense
KEYWORDS: Optical design, CMOS sensors, Imaging systems, Sensors, Silicon, Imaging spectroscopy, Near field, Terahertz radiation, Antennas, Field effect transistors

Showing 5 of 14 publications
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