Prof. Paul Scheunders
at Univ Antwerpen
SPIE Involvement:
Author
Publications (17)

Proceedings Article | 17 October 2013 Paper
Proc. SPIE. 8892, Image and Signal Processing for Remote Sensing XIX
KEYWORDS: Signal to noise ratio, Shape memory alloys, Reflectivity, Image processing, Computer simulations, Soil science, Neodymium, Signal processing, Vegetation, Remote sensing

Proceedings Article | 15 September 2008 Paper
Proc. SPIE. 7073, Applications of Digital Image Processing XXXI
KEYWORDS: Luminescence, Microscopy, Nerve, Signal to noise ratio, In vivo imaging, Sensors, Pre-clinical research, Video, Image registration, Visualization

Proceedings Article | 19 March 2008 Paper
Proc. SPIE. 6914, Medical Imaging 2008: Image Processing
KEYWORDS: Quantization, Image segmentation, Medical imaging, Magnetic resonance imaging, Tissues, Image filtering, Linear filtering, 3D image processing, Image processing, Signal attenuation

Proceedings Article | 2 October 2007 Paper
Proc. SPIE. 6763, Wavelet Applications in Industrial Processing V
KEYWORDS: Wavelets, Denoising, Global system for mobile communications, Signal to noise ratio, Remote sensing, Data modeling, Image fusion, Image filtering, Wavelet transforms, Statistical modeling

Proceedings Article | 2 October 2007 Paper
Proc. SPIE. 6763, Wavelet Applications in Industrial Processing V
KEYWORDS: Wavelets, Expectation maximization algorithms, Image restoration, Denoising, Principal component analysis, Deconvolution, Global system for mobile communications, Fourier transforms, Wavelet transforms, Signal to noise ratio

Showing 5 of 17 publications
Conference Committee Involvement (7)
Wavelet Applications in Industrial Processing VII
18 January 2010 | San Jose, California, United States
Wavelet Applications in Industrial Processing VI
21 January 2009 | San Jose, California, United States
Wavelet Applications in Industrial Processing V
11 September 2007 | Boston, MA, United States
Wavelet Applications in Industrial Processing IV
2 October 2006 | Boston, Massachusetts, United States
Wavelet Applications in Industrial Processing III
24 October 2005 | Boston, MA, United States
Showing 5 of 7 Conference Committees
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