Dr. Pawel Piotr Michalowski
at Institute of Microelectronics and Photonics
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 21 March 2023 Presentation
Proceedings Volume PC12421, (2023) https://doi.org/10.1117/12.2648902
KEYWORDS: Gallium nitride, Annealing, Ions, Silicon, Diffusion, Magnesium, Ion implantation, Chemical species, X-ray diffraction, Surface roughness

Proceedings Article | 6 November 2019 Paper
Proceedings Volume 11176, 111764K (2019) https://doi.org/10.1117/12.2533912
KEYWORDS: Molybdenum, Raman spectroscopy, Aluminum, Chemical vapor deposition, Sapphire, Oxygen, Ions, Graphene, Mass spectrometry, Microelectronics

Proceedings Article | 14 August 2018 Paper
Proceedings Volume 10830, 108300S (2018) https://doi.org/10.1117/12.2503624
KEYWORDS: Indium arsenide, Gallium arsenide, Raman spectroscopy, Scanning electron microscopy, Luminescence, X-ray diffraction, Absorbance, Arsenic, Crystals, Spectroscopy

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