Dr. Peisen S. Huang
Prof. of Mechanical Engineering/Assoc Dean for Res at UM-SJTU Joint Institute
SPIE Involvement:
Track Chair | Editor | Author
Publications (38)

Proceedings Article | 14 September 2011 Paper
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Fringe analysis, Phase shifting, Data modeling, Cameras, Error analysis, 3D modeling, 3D metrology, Projection systems, Miniature imaging systems, Structured light

Proceedings Article | 14 September 2011 Paper
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Microscopes, Fringe analysis, Phase shifting, Imaging systems, Cameras, Calibration, Ceramics, 3D metrology, Projection systems, Channel projecting optics

SPIE Journal Paper | 1 March 2010
OE Vol. 49 Issue 03
KEYWORDS: Fringe analysis, Facial recognition systems, Projection systems, 3D image processing, Detection and tracking algorithms, Phase shifts, Cameras, Skin, Fourier transforms, Databases

Proceedings Article | 10 September 2009 Paper
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Fringe analysis, Phase shifting, Imaging systems, Cameras, Calibration, Image acquisition, 3D modeling, 3D metrology, Projection systems, Visibility

Proceedings Article | 10 September 2009 Paper
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Fringe analysis, Phase shifting, 3D acquisition, 3D image reconstruction, Imaging systems, Cameras, Image acquisition, 3D modeling, Projection systems, 3D image processing

Showing 5 of 38 publications
Proceedings Volume Editor (8)

Showing 5 of 8 publications
Conference Committee Involvement (10)
Dimensional Optical Metrology and Inspection for Practical Applications II
25 August 2013 | San Diego, California, United States
Optical Metrology and Inspection for Industrial Applications II
5 November 2012 | Beijing, China
Dimensional Optical Metrology and Inspection for Practical Applications
22 August 2011 | San Diego, California, United States
Optical Metrology and Inspection for Industrial Applications
18 October 2010 | Beijing, China
Optical Inspection and Metrology for Non-Optics Industries
3 August 2009 | San Diego, California, United States
Showing 5 of 10 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top