Peter Giesen
at Holst Ctr
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 10 December 2009 Paper
Proceedings Volume 7520, 75200A (2009) https://doi.org/10.1117/12.837171
KEYWORDS: Silicon, Gold, Semiconducting wafers, Maskless lithography, Optical lithography, Flexible circuits, Transistors, Lithography, Critical dimension metrology, Electrodes

Proceedings Article | 21 March 2008 Paper
Wim de Laat, Mária Péter, François Furthner, Peter Giesen, Cheng-Qun Gui, Erwin Meinders
Proceedings Volume 6921, 69212F (2008) https://doi.org/10.1117/12.771947
KEYWORDS: Optical lithography, Semiconducting wafers, Lithography, Transistors, Image processing, Optical fiber cables, Critical dimension metrology, Scanning electron microscopy, Thin films, Silicon

Proceedings Article | 8 September 2005 Paper
Proceedings Volume 5877, 587703 (2005) https://doi.org/10.1117/12.618258
KEYWORDS: Mirrors, Stars, Telescopes, Mirror mounts, Optomechanical design, Interferometry, Kinematics, Optical instrument design, Sensors, Metrology

Proceedings Article | 8 September 2005 Paper
Proceedings Volume 5877, 587706 (2005) https://doi.org/10.1117/12.618263
KEYWORDS: Mirrors, Stars, Actuators, Telescopes, Jupiter, Planets, Space telescopes, Optomechanical design, Sensors, Titanium

Proceedings Article | 30 September 2004 Paper
Proceedings Volume 5528, (2004) https://doi.org/10.1117/12.560938
KEYWORDS: Mirrors, Telescopes, Stars, Space telescopes, Device simulation, Optical fibers, Diffusion tensor imaging, Imaging systems, Synthetic apertures, Aluminum

Showing 5 of 10 publications
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