Prof. Peter Hess
at Ruprecht-Karls-Univ Heidelberg
SPIE Involvement:
Author | Editor
Publications (6)

Proceedings Article | 28 May 2009 Paper
N. Salingue, D. Lingenfelser, P. Prunici, P. Hess
Proceedings Volume 7364, 73640F (2009) https://doi.org/10.1117/12.821176
KEYWORDS: Silicon, Natural surfaces, FT-IR spectroscopy, Spectroscopy, Molecules, Spectroscopic ellipsometry, Chemical species, Chemical analysis, Semiconductor lasers, Oxidation

Proceedings Article | 11 September 2006 Paper
P. Hess, P. Patzner, A. Osipov, Z. Hu, D. Lingenfelser, P. Prunici, A. Schmohl
Proceedings Volume 6325, 63250H (2006) https://doi.org/10.1117/12.680344
KEYWORDS: Silicon, Interfaces, Spectroscopy, FT-IR spectroscopy, Oxides, Spectroscopic ellipsometry, Dielectrics, Atmospheric modeling, Oxygen, Oxidation

Proceedings Article | 23 September 2002 Paper
Proceedings Volume 4817, (2002) https://doi.org/10.1117/12.453735
KEYWORDS: Absorption, Sensors, Photoacoustic spectroscopy, Modulation, Acoustics, Semiconductor lasers, Optical parametric oscillators, Signal detection, Resonators, Amplitude modulation

Proceedings Article | 7 June 2002 Paper
Proceedings Volume 4703, (2002) https://doi.org/10.1117/12.469610
KEYWORDS: Diamond, Carbon, Microcrystalline materials, Silicon films, Chemical vapor deposition, Acoustics, Crystals, Dispersion, Silicon, Boron

SPIE Press Book | 23 February 2000

Showing 5 of 6 publications
Conference Committee Involvement (1)
Testing, Reliability, and Application of Micro- and Nano-Material Systems
3 March 2003 | San Diego, California, United States
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