Prof. Peter Hess
at Ruprecht-Karls-Univ Heidelberg
SPIE Involvement:
Author | Editor
Publications (6)

Proceedings Article | 28 May 2009 Paper
Proc. SPIE. 7364, Nanotechnology IV
KEYWORDS: Silicon, Natural surfaces, FT-IR spectroscopy, Spectroscopy, Molecules, Spectroscopic ellipsometry, Chemical species, Chemical analysis, Semiconductor lasers, Oxidation

Proceedings Article | 11 September 2006 Paper
Proc. SPIE. 6325, Physical Chemistry of Interfaces and Nanomaterials V
KEYWORDS: Silicon, Interfaces, Spectroscopy, FT-IR spectroscopy, Oxides, Spectroscopic ellipsometry, Dielectrics, Atmospheric modeling, Oxygen, Oxidation

Proceedings Article | 23 September 2002 Paper
Proc. SPIE. 4817, Diode Lasers and Applications in Atmospheric Sensing
KEYWORDS: Absorption, Sensors, Photoacoustic spectroscopy, Modulation, Acoustics, Semiconductor lasers, Optical parametric oscillators, Signal detection, Resonators, Amplitude modulation

Proceedings Article | 7 June 2002 Paper
Proc. SPIE. 4703, Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
KEYWORDS: Diamond, Carbon, Microcrystalline materials, Silicon films, Chemical vapor deposition, Acoustics, Crystals, Dispersion, Silicon, Boron

SPIE Press Book | 23 February 2000

Showing 5 of 6 publications
Conference Committee Involvement (1)
Testing, Reliability, and Application of Micro- and Nano-Material Systems
3 March 2003 | San Diego, California, United States
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