Mr. Peter Kozlowski Profile

Peter Kozlowski

at Fraunhofer-IPM

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 21 June 2019 Presentation + Paper

Imaging detection and classification of particulate contamination on structured surfaces

Jan Schütz, Alexander Blättermann, Peter Kozlowski, Albrecht Brandenburg

Proceedings Volume 11056, 1105620 (2019) https://doi.org/10.1117/12.2525584

KEYWORDS: Particles, Sensors, Contamination, Metals, Aluminum, Light emitting diodes, Inspection, Head, Cameras, Modulation transfer functions

Read Abstract +

We present new imaging techniques for the detection and classification of particulate contamination on structured surfaces. This allows for cleanliness inspection directly on the sample. Classical imaging techniques for particle detection, such as dark-field imaging, are typically limited to flat surfaces because structures, scratches, or rough surfaces will give similar signals as particles. This problem is overcome using stimulated differential imaging. Stimulation of the sample, e.g. by air blasts, results in displacement of only the particles while sample structures remain in place. Thus, the difference of images before and after stimulation reveals the particles with high contrast. Cleanliness inspection systems also need to distinguish (often harmful) metallic particles from (often harmless) nonmetallic particles. A recognized classification method is measuring gloss. When illuminated with directed light, the glossy surface of metallic particles directly reflects most parts of the light. Non-metallic particles, in contrast, typically scatter most of the light uniformly. Here, we demonstrate a new imaging technique to measure gloss. For this purpose, several images of the sample with different angles of illumination are taken and analyzed for similarity.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years