Prof. Peter Lehmann
Chair/Measurement Technology at Univ Kassel
SPIE Involvement:
Conference Chair | Author | Editor
Publications (35)

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Diffraction, Metrology, Polarization, Sensors, Computer simulations, 3D modeling, Optical metrology, Finite element methods, Diffraction gratings

Proceedings Article | 21 June 2019 Presentation + Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Optical filters, Mirrors, LED lighting, Interferometers, Cameras, Sensors, Calibration, Interferometry, Wavefront sensors, Phase retrieval

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Confocal microscopy, Microscopes, Curium, Mirau interferometers, Interferometers, Sensors, Interferometry, Atomic force microscopy, Optical resolution, Environmental sensing

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Interferometers, Cameras, Sensors, Interferometry, Optical testing, Distance measurement, Line scan image sensors

Proceedings Article | 24 May 2018 Presentation + Paper
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Light emitting diodes, LED lighting, Modulation, Interferometers, Cameras, Calibration, Glasses, Interferometry, Phase retrieval

Showing 5 of 35 publications
Proceedings Volume Editor (6)

SPIE Conference Volume | 22 August 2019

SPIE Conference Volume | 18 July 2017

SPIE Conference Volume | 18 May 2015

SPIE Conference Volume | 9 April 2013

SPIE Conference Volume | 26 May 2011

Showing 5 of 6 publications
Conference Committee Involvement (14)
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Munich, Germany
Optics and Photonics for Advanced Dimensional Metrology
6 April 2020 | Online Only, France
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Optical Micro- and Nanometrology
25 April 2018 | Strasbourg, France
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Showing 5 of 14 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top