Philip Coane
Associate Director IFM Operations at Louisiana Tech University
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 22 January 2005 Paper
Proceedings Volume 5721, (2005) https://doi.org/10.1117/12.591194
KEYWORDS: Microlens, Polymers, Dynamical systems, Microfluidics, Fluid dynamics, Imaging systems, Optical fabrication, Microopto electromechanical systems, Optical testing, Optical imaging

Proceedings Article | 18 August 2000 Paper
Vijay-Anandh Shanmugam, Michael Vasile, Philip Coane
Proceedings Volume 4179, (2000) https://doi.org/10.1117/12.395695
KEYWORDS: X-rays, Silicon, Silica, Glasses, Photoresist processing, Silicon films, Sol-gels, Polymethylmethacrylate, Semiconducting wafers, X-ray lithography

Proceedings Article | 11 August 2000 Paper
Yohannes Desta, Georg Aigeldinger, Kevin Zanca, Philip Coane, Jost Goettert, Michael Murphy
Proceedings Volume 4175, (2000) https://doi.org/10.1117/12.395599
KEYWORDS: Photomasks, X-rays, Gold, X-ray lithography, Polymethylmethacrylate, Optical lithography, Silicon, Photoresist processing, Titanium, Nickel

Proceedings Article | 10 April 2000 Paper
Georg Aigeldinger, Philip Coane, Benjamin Craft, Jost Goettert, Sam Ledger, Zhong Ling, Harish Manohara, Louis Rupp
Proceedings Volume 4019, (2000) https://doi.org/10.1117/12.382294
KEYWORDS: Photomasks, Polymethylmethacrylate, X-ray lithography, X-rays, Gold, Beryllium, Optical filters, Scanning electron microscopy, Teeth, Microfabrication

Proceedings Article | 3 September 1999 Paper
Philip Coane, Robert Giasolli, Olga Vladimirsky, Yuli Vladimirsky
Proceedings Volume 3875, (1999) https://doi.org/10.1117/12.360465
KEYWORDS: X-rays, Photomasks, Surface finishing, X-ray lithography, Surface roughness, Polishing, Gold, Radium, Micromachining, Electroplating

Showing 5 of 8 publications
Proceedings Volume Editor (1)

SPIE Conference Volume | 11 August 2000

Conference Committee Involvement (3)
Reliability, Testing, and Characterization of MEMS/MOEMS II
27 January 2003 | San Jose, CA, United States
Materials and Device Characterization in Micromachining III
18 September 2000 | Santa Clara, CA, United States
Micromachining and Microfabrication
30 March 1999 | Paris, France
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