Dr. Philippe Jonnard
at Lab de Chimie Physique - Matière et Rayonnement
SPIE Involvement:
Author
Publications (13)

SPIE Journal Paper | 17 November 2017 Open Access
Meiyi Wu, Catherine Burcklen, Jean-Michel André, Karine Le Guen, Angelo Giglia, Konstantin Koshmak, Stefano Nannarone, Françoise Bridou, Evgueni Meltchakov, Sébastien de Rossi, Franck Delmotte, Philippe Jonnard
OE, Vol. 56, Issue 11, 119801, (November 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.11.119801

SPIE Journal Paper | 1 November 2017
Meiyi Wu, Catherine Burcklen, Jean-Michel André, Karine Le Guen, Angelo Giglia, Konstantin Koshmak, Stefano Nannarone, Françoise Bridou, Evgueni Meltchakov, Sébastien de Rossi, Franck Delmotte, Philippe Jonnard
OE, Vol. 56, Issue 11, 117101, (November 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.11.117101
KEYWORDS: Reflectivity, Mirrors, X-rays, X-ray fluorescence spectroscopy, Interfaces, Chromium, Multilayers, Sputter deposition, Sensors, Luminescence

Proceedings Article | 31 May 2017 Presentation + Paper
M.-Y. Wu, V. Ilakovac, J.-M. André, K. Le Guen, A. Giglia, J.-P. Rueff, Q.-S. Huang, Z.-S. Wang, P. Jonnard
Proceedings Volume 10235, 102350F (2017) https://doi.org/10.1117/12.2265630
KEYWORDS: X-rays, Photoemission spectroscopy, Interfaces, Sputter deposition, X-ray optics, Nitrogen, Chemical elements, Palladium, Multilayers, Oxidation, Extreme ultraviolet, Argon

Proceedings Article | 17 May 2017 Presentation + Paper
Philippe Jonnard, Jean-Michel André, Karine Le Guen, Meiyi Wu, Emiliano Principi, Alberto Simoncig, Alessandro Gessini, Riccardo Mincigrucci, Claudio Masciovecchio, Olivier Peyrusse
Proceedings Volume 10243, 102430D (2017) https://doi.org/10.1117/12.2265654
KEYWORDS: Magnesium, Free electron lasers, Solids, Extreme ultraviolet, Solid state lasers, Avalanche photodiodes, X-rays, Plasma, Ionization, X-ray lasers, Silicon

Proceedings Article | 3 May 2013 Paper
Zhanshan Wang, Qi Zhong, Zhong Zhang, Jingtao Zhu, Yuhong Bai, Philippe Jonnard, Karine Le Guen, Jean-Michel Andre
Proceedings Volume 8777, 87771F (2013) https://doi.org/10.1117/12.2017590
KEYWORDS: Reflectivity, Zirconium, Multilayers, Aluminum, Extreme ultraviolet, Surface roughness, Thermography, Deposition processes, Interfaces, Silicon

Showing 5 of 13 publications
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