Dr. Pierre Barritault
Retired at CEA-LETI
SPIE Involvement:
Publications (14)

Proceedings Article | 2 March 2020 Paper
Proc. SPIE. 11287, Photonic Instrumentation Engineering VII
KEYWORDS: Refractive index, Optical sensors, Imaging systems, Scattering, Sensors, Particles, Light scattering, Laser scattering, Photodiodes, Semiconducting wafers

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11088, Optical Sensing, Imaging, and Photon Counting: From X-Rays to THz 2019
KEYWORDS: Mid-IR, Scattering, Sensors, Particles, Silicon, Light scattering, Quantum cascade lasers, Photoacoustic spectroscopy, Acoustics, Absorption

Proceedings Article | 4 March 2019 Presentation + Paper
Proc. SPIE. 10923, Silicon Photonics XIV
KEYWORDS: Microelectromechanical systems, Mid-IR, Waveguides, Cladding, Sensors, Silicon, Quantum cascade lasers, Photonic integrated circuits, Semiconducting wafers, Absorption

Proceedings Article | 16 February 2017 Paper
Proc. SPIE. 10106, Integrated Optics: Devices, Materials, and Technologies XXI
KEYWORDS: Mid-IR, Photodetectors, Photonic devices, Gas sensors, Waveguides, Sensors, Germanium, Silicon, Quantum cascade lasers, Multiplexing, Gas lasers, Silicon photonics, Multiplexers, Carbon monoxide, Atmospheric sensing

Proceedings Article | 1 December 2008 Paper
Proc. SPIE. 7140, Lithography Asia 2008
KEYWORDS: Data modeling, Spectroscopy, Error analysis, Silicon, Polarimetry, Atomic force microscopy, Scatterometry, 3D metrology, Critical dimension metrology, Diffraction gratings

Showing 5 of 14 publications
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