Dr. Pierre M. Boher
Director R&D at ELDIM
SPIE Involvement:
Conference Program Committee | Author
Profile Summary

Pierre Boher earned an Engineer degree at the ECP (Ecole Centrale des Arts et Manufactures) in 1982. After earning his Ph.D. in material sciences in 1984, he worked in the French Philips Laboratories during nine years on the deposition and characterization of very thin films and multilayers. R&D manager at SOPRA between 1995 and 2002, he participates to the development of different metrology tools for non destructive characterization mainly for microelectronics. He joined ELDIM in 2003 to be involved in the research and development of new metrology heads.
Publications (60)

Proceedings Article | 24 February 2020 Paper
Proc. SPIE. 11300, Vertical-Cavity Surface-Emitting Lasers XXIV
KEYWORDS: Near infrared, Light sources, Vertical cavity surface emitting lasers, Safety, Fourier optics, Stereoscopy, Sensors, Light emitting diodes, Spatial resolution, Calibration

Proceedings Article | 19 February 2018 Paper
Proc. SPIE. 10556, Advances in Display Technologies VIII
KEYWORDS: Organic light emitting diodes, Colorimetry, Televisions, High dynamic range imaging, Fourier optics, CIE 1931 color space, LCDs

Proceedings Article | 16 February 2017 Presentation + Paper
Proc. SPIE. 10126, Advances in Display Technologies VII
KEYWORDS: High angular resolution imaging, Stray light, Goniophotometry, Quality systems, LCDs, Fourier optics, Optical testing, Imaging systems, CMOS sensors, Sensors, Glasses, Control systems, Robotics, Ferroelectric LCDs

Proceedings Article | 7 March 2016 Paper
Proc. SPIE. 9770, Advances in Display Technologies VI
KEYWORDS: LCDs, Reflectivity, Image quality, Flexible displays, Ray tracing, Televisions, Computer simulations, Reflective displays, Bidirectional reflectance transmission function, Visualization, Video, Multimedia, Mathematics, Distortion, Fourier optics, Organic light emitting diodes, Diffraction, Light sources and illumination

Proceedings Article | 13 March 2015 Paper
Proc. SPIE. 9398, Measuring, Modeling, and Reproducing Material Appearance 2015
KEYWORDS: Bidirectional reflectance transmission function, Polarizers, Fourier optics, LCDs, Reflectivity, Reflection, Collimation, Sensors, Spatial resolution, Backscatter

Showing 5 of 60 publications
Conference Committee Involvement (11)
Advances in Display Technologies XII
22 January 2022 | San Francisco, California, United States
Advances in Display Technologies XI
6 March 2021 | Online Only, California, United States
Advances in Display Technologies X
5 February 2020 | San Francisco, California, United States
Advances in Display Technologies IX
7 February 2019 | San Francisco, California, United States
Advances in Display Technologies VIII
31 January 2018 | San Francisco, California, United States
Showing 5 of 11 Conference Committees
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