Dr. Pierre Lhuissier
at Science et Ingénierie des Matériaux et Procédés
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 March 2019 Paper
Proceedings Volume 10948, 109481S (2019) https://doi.org/10.1117/12.2511944
KEYWORDS: Synchrotrons, Phase contrast, Speckle, X-rays, 3D image processing, Speckle imaging, X-ray imaging, Phase retrieval

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