Prof. Ping Li
at National Institute of Metrology
SPIE Involvement:
Author
Publications (24)

Proceedings Article | 8 October 2015 Paper
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Visible radiation, Reflection, Sensors, Calibration, Reflectivity, Bidirectional reflectance transmission function, Measurement devices, Infrared radiation, Aluminum, Standards development

Proceedings Article | 8 October 2015 Paper
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Light sources, Metrology, Reflection, Sensors, Reflectivity, Control systems, Computer programming, Bidirectional reflectance transmission function, Measurement devices, Infrared radiation

Proceedings Article | 18 September 2014 Paper
Proc. SPIE. 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Optical spheres, Sensors, Calibration, Satellites, Remote sensing, Coating, Lamps, Power supplies, Control systems, Integrating spheres

Proceedings Article | 21 August 2014 Paper
Proc. SPIE. 9283, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
KEYWORDS: Optical design, Light sources, Metrology, Sensors, Error analysis, Computer simulations, Monte Carlo methods, Ray tracing, Optical simulations, Geometrical optics

Proceedings Article | 15 October 2012 Paper
Proc. SPIE. 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Staring arrays, Optical spheres, Data modeling, Imaging systems, Sensors, Calibration, Monte Carlo methods, Optoelectronic devices, Charge-coupled devices, Integrating spheres

Showing 5 of 24 publications
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