Dr. Ping Zhou
Student at ASML US Inc
SPIE Involvement:
Conference Program Committee | Author
Publications (18)

SPIE Journal Paper | 23 December 2016
OE Vol. 55 Issue 12
KEYWORDS: Monochromatic aberrations, Mirrors, Actinium, Astatine, Optical engineering, Aspheric lenses, Distance measurement, MATLAB, Tolerancing, Zernike polynomials

Proceedings Article | 22 July 2016 Paper
Proc. SPIE. 9912, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation II
KEYWORDS: Mirrors, Mirrors, Solar telescopes, Solar telescopes, Metrology, Interferometry, Optical fabrication, Computer generated holography, Bidirectional reflectance transmission function, Aspheric lenses, Off axis mirrors, Surface finishing

Proceedings Article | 8 September 2014 Paper
Proc. SPIE. 9195, Optical System Alignment, Tolerancing, and Verification VIII
KEYWORDS: Monochromatic aberrations, Gaussian beams, Microlens array, Imaging systems, Sensors, Ions, Image sensors, Microlens, Geometrical optics, Spherical lenses

Proceedings Article | 7 August 2014 Paper
Proc. SPIE. 9151, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation
KEYWORDS: Monochromatic aberrations, Telescopes, Mirrors, Optical spheres, Image segmentation, Error analysis, Wavefronts, Distortion, Computer generated holography, Data processing

Proceedings Article | 7 August 2014 Paper
Proc. SPIE. 9151, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation
KEYWORDS: Monochromatic aberrations, Telescopes, Mirrors, Polishing, Sensors, Image segmentation, Wavefronts, Optical testing, Active optics, Surface finishing

Showing 5 of 18 publications
Conference Committee Involvement (6)
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Optical Manufacturing and Testing XIII
24 August 2020 | Online Only, California, United States
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Optical Metrology and Inspection for Industrial Applications V
11 October 2018 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IV
12 October 2016 | Beijing, China
Showing 5 of 6 Conference Committees
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