Qiang Xu
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 February 2009 Paper
Yongpeng Zhao, Qiang Xu, Xingqiang Zhang
Proceedings Volume 7276, 72761J (2009) https://doi.org/10.1117/12.823433
KEYWORDS: Capillaries, Extreme ultraviolet, Plasma, Electrodes, Extreme ultraviolet lithography, Resistance, Semiconductor manufacturing, Semiconductors, Tin, Switches

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