Qingxin Meng
at Guilin Univ of Electronic Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 November 2010 Paper
Proceedings Volume 7855, 78552B (2010) https://doi.org/10.1117/12.869035
KEYWORDS: Iron, Image processing, Error analysis, Standards development, Image quality, Image classification, Inspection, Image segmentation, Image analysis, Optics manufacturing

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