Qingxin Meng
at Guilin Univ of Electronic Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 November 2010 Paper
Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications
KEYWORDS: Iron, Image segmentation, Image processing, Error analysis, Inspection, Image analysis, Image quality, Image classification, Optics manufacturing, Standards development

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top