Dr. Rafael Hidalgo-Gato
at Lortek S.Coop.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 May 2020 Presentation + Paper
Proceedings Volume 11409, 114090D (2020) https://doi.org/10.1117/12.2558265
KEYWORDS: Inspection, Detection and tracking algorithms, Signal to noise ratio, Thermography, Defect detection, Image processing, Algorithm development, Statistical analysis, Fourier transforms, Manufacturing

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